Jesd 78d
Web3. Determined according to JEDEC Standard JESD78D, IC Latch-up Test. • Test was performed at 125 °C case temperature (Class II). • I/O pins pass ±100 mA I-test with IDD … WebLatch up current, per JESD78D 400 mA. DG9424E, DG9425E, DG9426E www.vishay.com Vishay Siliconix S23-0124-Rev. D, 06-Mar-2024 3 Document Number: 75770 For technical questions, contact: [email protected] THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE.
Jesd 78d
Did you know?
Web1 apr 2016 · Full Description. This standard covers the I-test and Vsupply overvoltage latch-up testing of integrated circuits. The purpose of this standard is to establish a method for … Web• Latch-up performance exceeds 100 mA per JESD78D Class II • Inputs accept voltages up to 2.75 V • Low noise overshoot and undershoot < 10% of VCCO • IOFF circuitry provides partial power-down mode operation • Multiple package options • Specified from …
Web1 dic 2024 · Full Description. This standard establishes the procedure for testing, evaluation and classification of devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined latch-up stress. This standard covers a current-injection test (Signal Pin Test) and an overvoltage test (Supply Test).
Web2. Achieved JESD78D Class II rating. The ADG5298 was stressed to ±500 mA with a 10 ms pulse at the maximum temperature of the device (210°C). 3. 0.2 pC Charge Injection. 4. Dual-Supply Operation. For applications where the analog signal is bipolar, the ADG5298 can operate from dual supplies of up to ±22 V. 5. Single-Supply Operation. Web3. Determined according to JEDEC Standard JESD78D, IC Latch-up Test. The test produced the following results: • Test was performed at 125 °C case temperature (Class …
Web3. Determined according to JEDEC Standard JESD78D, IC Latch-up Test. The test produced the following results: • Test was performed at 125 °C case temperature (Class II). • I/O pins pass +100/-100 mA I-test with IDD current limit at 400 mA (VDD collapsed during positive injection).
WebPublished: Dec 2024. This standard covers the I-test and Vsupply overvoltage latch-up testing of integrated circuits. The purpose of this standard is to establish a method for … all stars glamazonWebJESD78F.01. Dec 2024. This standard covers the I-test and Vsupply overvoltage latch-up testing of integrated circuits. The purpose of this standard is to establish a method for determining IC latch-up characteristics and to define latch-up detection criteria. Latch-up characteristics are extremely important in determining product reliability ... all stars future gamehttp://www.beice-sh.com/pdf/JESD%E6%A0%87%E5%87%86/JESD78E.pdf all stars glitterWebJEDEC Standard No. 78B Page 2 2 Terms and definitions The following terms and definitions apply to this test method. cool-down time: The period of time between successive applications of trigger pulses, or the period of time between the removal of the V supply voltage and the application of the next trigger pulse. (See Figures 2, all stars hy-pro deluxeWebThe 74AXP4T245 is an 4-bit dual supply translating transceiver with 3-state outputs that enable bidirectional level translation. The device can be used as two 2-bit transceivers or … all star sign coWeb12 ott 2024 · 例如，adg5412f通过了1秒脉宽±500 ma的 jesd78d闩锁测试，这是规范中最严格的测试。 模拟性能 新型ADI故障保护开关不仅能够实现业界领先的鲁棒性（过 电压保护、高ESD额定值、上电时无数字输入控制时处于已 知状态），而且还具有业界领先的模拟性能。 all star signs llcWeb3. Determined according to JEDEC Standard JESD78D, IC Latch-up Test. • Test was performed at 125 °C case temperature (Class II). • I/O pins pass ±100 mA I-test with IDD … all stars glitter fire